Uwe D. Hanebeck, Karlsruhe Institute of Technology (KIT), Germany
Florian Pfaff, Karlsruhe Institute of Technology (KIT), Germany

Ren C. Luo, National Taiwan University, Taiwan

Thomas C. Henderson, University of Utah, USA
Rüdiger Dillmann, Karlsruhe Institute of Technology (KIT), Germany
Suk-Han Lee, SungKyunKwan University, Korea
Roland Siegwart, Swiss Federal Institute of Technology (ETH), Zürich, Switzerland

Marcus Baum, University of Göttingen, Germany
Thomas Seel, Technical University of Berlin

Benjamin Noack, Otto von Guericke University Magdeburg (OVGU), Germany
Daniel Clarke, Adarga Insights, UK

Ondřej Straka, University of West Bohemia, Czech Republic
Jindřich Duník, University of West Bohemia, Czech Republic

Manon Kok, Delft University of Technology, Netherlands

Lyudmila Mihaylova, University of Sheffield, UK
Wolfgang Koch, Fraunhofer FKIE, Germany

Felix Govaers, Fraunhofer FKIE, Germany

Thomas Längle, Fraunhofer IOSB, Germany

Marco Huber, University of Stuttgart, Germany

Daniel Clark, Telecom SudParis, France
Daniel Clarke, Cranfield University, UK
David Crouse, Naval Research Laboratory, USA
Dominik Baumann, RWTH Aachen University, Germany
Emre Özkan, Orta Doğu Teknik Üniversitesi, Turkey
Florian Pfaff, Karlsruhe Institute of Technology, Germany
Fred Daum, Raytheon, USA
Gustaf Hendeby, Linköping University, Sweden
Jindřich Duník, University of West Bohemia, Czech Republic
Johannes Reuter, HTWG Konstanz, Germany
Jonathan Kelly, University of Toronto, Canada
Manon Kok, Delft University of Technology, Nederland
Nageswara Rao, Oak Ridge National Laboratory, USA
Nikhil Deshpande, IIT, Italy
Norikazu Ikoma, Nippon Institute of Technology, Japan
Ondrej Straka University of West Bohemia, Czech Republic
Rod Grupen, UMass Amherst, USA
Simon Maskell, University of Liverpool, UK
Soren Hauberg, Technical University of Denmark, Denmark
Thomas Henderson, University of Utah, USA
Yangquan Chen, University of California, Merced, USA